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Update of ZinView announced by Optech

Toronto, 29 August 2006: Optech Incorporated, company involved in the development and manufacture of Lidar survey instruments, has announced an update of its ZinView software: ZinView, version 3.2.

ZinView enables users to process data quickly and check for gaps and other errors without having to take the data into REALM for full processing. ZinView 3.2 now offers new min/max range and scan angle cut-off filters, DXF file import (shape file), camera footprint calculation in 3D mode, LAS output supports for four pulses (ALTM models 30/70 or 3100) and Optech’s open source IXF format for ground based 3D lidar scanners (such as the ILRIS-3D family of scanners from Optech). It also has real-time best estimate trajectory (RBET) that can be generated in POSPac or TerraPhoto format.

A 30-day free trial version of ZinView, and the fully licensed version, are available on the Optech FTP download site: (ftp://ftp.optech.ca/altm/Customerdowload/software/Zinview).

Optech Inc.
Optech, based in Toronto, Canada, deals in development, manufacture and support of advanced laser-based survey instruments. The company offers client-driven solutions in airborne terrestrial mapping, airborne laser bathymetry, 3D laser imaging, space-based atmospheric monitors, space borne landing/docking systems, mine cavity monitoring systems, and industrial process control equipment.