Pictometry announces partnership with LPA Systems

Pictometry announces partnership with LPA Systems

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Rochester, USA, 2 May 2006 – Pictometry International Corp. and LPA Systems, a developer of spectral imaging and geospatial intelligence applications, announced that the two firms have formed a business partnership. Under terms of the partnership agreement, Pictometry will market a joint solution that integrates LPA Eco-View infrared analysis software with the company’s professional GIS software (Electronic Field Study). The end result is an analytical tool for improved environmental monitoring and planning.

“When you combine the power of Pictometry’s oblique aerial images with LPA’s infrared solution, Eco-View, our mutual customers can now obtain a more informed assessment of the environmental trends in their area, such as wetlands management and vegetative health,” said Ray Shady, Vice President of business development at LPA Systems.

Pictometry’s software enables users to easily access up to 12 different oblique (3D-like, at an angle) views of any property, building, highway, or other feature in an area. The software also enables users to obtain measurements such as distance, height, elevation, and area directly from the oblique imagery as well as overlay infrared data and other GIS information.